XRF Instrument

Siner X is an X-ray fluorescence spectrometer devoted to the analysis of materials:

  • Qualitative and quantitative determination of the sample composition;
  • Measurement of the thickness of coatings.

X-ray tube

  • Ta anode
  • Max voltage 40 kV
  • Max current 100 μA
  • Air cooling

Si-PIN Detector

  • Resolution 180 eV
  • Be window 0,5 mm
  • Peltier cooler
  • Detectable elements Z > 16 (sulphur)

SinRX software

  • General bulk and thin-film analysis using a “fundamental parameters approach”
  • Operating under WindowsXP, Windows Vista, and Windows 7,,Windows 8, Windows 10
  • Many different formats allowed for input spectra to be analysed
  • Analysis with or without standards
  • Flexible and user-friendly